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Effects of Wavelength and Defect Density on the Efficiency of (In,Ga)N-Based Light-Emitting Diodes

Markus Pristovsek, An Bao, Rachel A. Oliver, Tom Badcock, Muhammad Ali, and Andrew Shields
Phys. Rev. Applied 7, 064007 – Published 5 June 2017

Abstract

We measure the electroluminescence of light-emitting diodes (LEDs) on substrates with low dislocation densities (LDD) at 106cm2 and low 108cm2, and compare them to LEDs on substrates with high dislocation densities (HDD) closer to 1010cm2. The external quantum efficiencies (EQEs) are fitted using the ABC model with and without localization. The nonradiative-recombination (NR) coefficient A is constant for HDD LEDs, indicating that the NR is dominated by dislocations at all wavelengths. However, A strongly increases for LDD LEDs by a factor of 20 when increasing the emission wavelength from 440 to 540 nm. We attribute this to an increased density of point defects due to the lower growth temperatures used for longer wavelengths. The radiative recombination coefficient B follows the squared wave-function overlap for all samples. Using the observed coefficients, we calculate the peak efficiency as a function of the wavelength. For HDD LEDs the change of wave-function overlap (i.e., B) is sufficient to reduce the EQE as observed, while for LDD LEDs also the NR coefficient A must increase to explain the observed EQEs. Thus, reducing NR is important to improving the EQEs of green LEDs, but this cannot be achieved solely by reducing the dislocation density: point defects must also be addressed.

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  • Received 7 March 2017

DOI:https://doi.org/10.1103/PhysRevApplied.7.064007

© 2017 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Markus Pristovsek*, An Bao, and Rachel A. Oliver

  • Department of Materials Science and Metallurgy, University of Cambridge, 27 Charles Babbage Road, Cambridge CB3 0FS, United Kingdom

Tom Badcock, Muhammad Ali, and Andrew Shields

  • Toshiba Research Europe Ltd., Cambridge Research Laboratory, 208 Science Park, Milton Road, Cambridge CB4 0GZ, United Kingdom

  • *Present address: Center for Integrated Research of Future Electronics, Institute for Materials and Systems for Sustainability, Nagoya University, 1 Furo-cho, Chikusa-Ku, Nagoya 464-8603, Japan. pristovsek@nagoya-u.ac.jp
  • Present address: Oclaro Technology Ltd., Caswell, Towcester NN12 8EQ, United Kingdom.
  • Present address: Osram Opto Semiconductors GmbH, Leibnizstr. 4, 93055 Regensburg, Germany.

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Vol. 7, Iss. 6 — June 2017

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