Memory effects in spontaneous emission processes

Arne L. Grimsmo, Asle H. Vaskinn, Per K. Rekdal, and Bo-Sture K. Skagerstam
Phys. Rev. A 87, 022101 – Published 4 February 2013

Abstract

We consider a quantum-mechanical analysis of spontaneous emission in terms of an effective two-level system with a vacuum decay rate Γ0 and transition angular frequency ωA. Our analysis is in principle exact, even though presented as a numerical solution of the time evolution including memory effects. The results so obtained are confronted with previous discussions in the literature. In terms of the dimensionless lifetime τ=tΓ0 of spontaneous emission, we obtain deviations from exponential decay of the form O(1/τ) for the decay amplitude as well as the previously obtained asymptotic behaviors of the form O(1/τ2) or O(1/τln2τ) for τ1. The actual asymptotic behavior depends on the adopted regularization procedure as well as on the physical parameters at hand. We show that for any reasonable range of τ and for a sufficiently large value of the required angular frequency cutoff ωc of the electromagnetic fluctuations, i.e., ωcωA, one obtains either a O(1/τ) or a O(1/τ2) dependence. In the presence of physical boundaries, which can change the decay rate with many orders of magnitude, the conclusions remains the same after a suitable rescaling of parameters.

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  • Received 18 September 2012

DOI:https://doi.org/10.1103/PhysRevA.87.022101

©2013 American Physical Society

Authors & Affiliations

Arne L. Grimsmo1,2,*, Asle H. Vaskinn1,†, Per K. Rekdal3,‡, and Bo-Sture K. Skagerstam1,4,§

  • 1Department of Physics, The Norwegian University of Science and Technology, N-7491 Trondheim, Norway
  • 2Department of Physics, The University of Auckland, Private Bag 92019, Auckland, New Zealand
  • 3Molde University College, P.O. Box 2110, N-6402 Molde, Norway
  • 4Centre for Advanced Study (CAS), Drammensveien 78, N-0271 Oslo, Norway

  • *arne.grimsmo@ntnu.no
  • asle.vaskinn@ntnu.no
  • per.k.rekdal@himolde.no
  • §bo-sture.skagerstam@ntnu.no

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Vol. 87, Iss. 2 — February 2013

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