• Open Access

Linear-frequency conversion with time-varying metasurfaces

Claude Amra, Ali Passian, Philippe Tchamitchian, Mauro Ettorre, Ahmed Alwakil, Juan Antonio Zapien, Paul Rouquette, Yannick Abautret, and Myriam Zerrad
Phys. Rev. Research 6, 013002 – Published 2 January 2024

Abstract

Frequency conversion is a hallmark of nonlinearity. The spectral manifestations, emergent within a system, can typically be attributed to a marked nonlinearity within the material properties, complex geometric configurations, and/or the unique functional form of interactions taking place in the constitutive subsystems. These phenomena, irrespective of their origins, have been harnessed and exploited in applications ranging from the generation of entangled photons, a cornerstone in quantum technologies, to nanomechanical frequency mixing, advancing subsurface scanning probe microscopy. Here, we propose a frequency conversion mechanism based on time-varying metasurfaces, an emerging frontier in metamaterial research. We show how temporal properties of metasurfaces can effectively emulate a nonlinear medium, thereby facilitating frequency conversion. The proposed material configuration has the potential not only to advance integrated photonics and quantum optics, but also to create opportunities in quantum sensing, quantum materials, and crucially quantum communications.

  • Figure
  • Figure
  • Figure
  • Received 20 September 2023
  • Accepted 21 November 2023

DOI:https://doi.org/10.1103/PhysRevResearch.6.013002

Published by the American Physical Society under the terms of the Creative Commons Attribution 4.0 International license. Further distribution of this work must maintain attribution to the author(s) and the published article's title, journal citation, and DOI.

Published by the American Physical Society

Physics Subject Headings (PhySH)

  1. Research Areas
Atomic, Molecular & Optical

Authors & Affiliations

Claude Amra*

  • Aix Marseille Univ, CNRS, Centrale Marseille, Institut Fresnel, Faculté des Sciences - Campus Saint Jérôme, Avenue Escadrille Normandie-Niémen, 13397 Marseille, France

Ali Passian

  • Quantum Computing and Sensing Group, Computational Sciences and Engineering Division, Oak Ridge National Laboratory, Oak Ridge Tennessee 37831, USA

Philippe Tchamitchian

  • Independent Mathematician, 33580 Neuffons, France

Mauro Ettorre and Ahmed Alwakil§

  • Université de Rennes 1, Institut d'Electronique et des Technologies du numéRique (IETR), UMR 6164, Rennes, France

Juan Antonio Zapien

  • Department of Materials Science and Engineering, City University of Hong Kong, Kowloon, Hong Kong SAR

Paul Rouquette

  • Aix Marseille Univ, CNRS, CNES, LAM UMR 7326, Marseille, France

Yannick Abautret# and Myriam Zerrad**

  • Aix Marseille Univ, CNRS, Centrale Marseille, Institut Fresnel, Marseille, France

  • *claude.amra@fresnel.fr
  • passianan@ornl.gov
  • mauro.ettorre@univ-rennes1.fr
  • §ahmed.diaa.alwakil@gmail.com
  • apjazs@cityu.edu.hk
  • paul.rouquette@lam.fr
  • #abautret@fresnel.fr
  • **myriam.zerrad@fresnel.fr

Article Text

Click to Expand

References

Click to Expand
Issue

Vol. 6, Iss. 1 — January - March 2024

Subject Areas
Reuse & Permissions
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review Research

Reuse & Permissions

It is not necessary to obtain permission to reuse this article or its components as it is available under the terms of the Creative Commons Attribution 4.0 International license. This license permits unrestricted use, distribution, and reproduction in any medium, provided attribution to the author(s) and the published article's title, journal citation, and DOI are maintained. Please note that some figures may have been included with permission from other third parties. It is your responsibility to obtain the proper permission from the rights holder directly for these figures.

×

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×