Dynamic Scaling near the Percolation Threshold in Thin Au Films

R. B. Laibowitz and Yuval Gefen
Phys. Rev. Lett. 53, 380 – Published 23 July 1984
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Abstract

We report on measurements of both the ac conductivity (σ) and the ac dielectric constant (ε) of thin Au films near their percolation threshold for frequencies between 100 Hz and 10 MHz. In the critical regime, σωx and εωy. We obtain x=0.95±0.05 and y=0.13±0.05, in agreement with a general relation x+y=1. These results are significantly different from predictions based on finite size scaling of the dc conductivity or diffusion on independent percolation clusters, providing evidence for the importance of electron-electron interaction effects.

  • Received 12 April 1984

DOI:https://doi.org/10.1103/PhysRevLett.53.380

©1984 American Physical Society

Authors & Affiliations

R. B. Laibowitz

  • IBM Research Center, Yorktown Heights, New York 10598

Yuval Gefen

  • Institute for Theoretical Physics, University of California, Santa Barbara, California 93106

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Vol. 53, Iss. 4 — 23 July 1984

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