Electroreflectance Study of NiO

Jerrold L. McNatt
Phys. Rev. Lett. 23, 915 – Published 20 October 1969
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Abstract

By using a thin NiO single-crystal sample, it has been possible to observe electroreflectance spectra between 3.0 and 5.0 eV. The results of this study and a recent photoconductivity investigation suggest that an energy-band description which includes the 3d electrons is necessary for a full description of NiO interband optical properties.

  • Received 31 July 1969

DOI:https://doi.org/10.1103/PhysRevLett.23.915

©1969 American Physical Society

Authors & Affiliations

Jerrold L. McNatt

  • Advanced Materials Research and Development Laboratory, Pratt and Whitney Aircraft, Middletown, Connecticut 06458

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Issue

Vol. 23, Iss. 16 — 20 October 1969

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