Abstract
We investigated the electronic properties around grain boundaries of polycrystalline films as a function of Ga content, using scanning tunneling spectroscopy. Spectra acquired on samples with low Ga content ( and 0.33) reveal downward band bending with respect to adjacent -type grains, suggesting type inversion at the surface of grain boundaries. Such a behavior was not observed for samples with high Ga contents. These results are consistent with our atomic force microscopy data and may shed light on the origin of the -dependent efficiency for polycrystalline -based solar cells.
- Received 14 September 2011
DOI:https://doi.org/10.1103/PhysRevLett.108.076603
© 2012 American Physical Society