Microscopic Evidence for the Modification of the Electronic Structure at Grain Boundaries of Cu(In1x,Gax)Se2 Films

Doron Azulay, Isaac Balberg, and Oded Millo
Phys. Rev. Lett. 108, 076603 – Published 14 February 2012

Abstract

We investigated the electronic properties around grain boundaries of polycrystalline Cu(In1x,GaxSe2) films as a function of Ga content, using scanning tunneling spectroscopy. Spectra acquired on samples with low Ga content (x=0 and 0.33) reveal downward band bending with respect to adjacent p-type grains, suggesting type inversion at the surface of grain boundaries. Such a behavior was not observed for samples with high Ga contents. These results are consistent with our atomic force microscopy data and may shed light on the origin of the x-dependent efficiency for polycrystalline Cu(In1x,GaxSe2)-based solar cells.

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  • Received 14 September 2011

DOI:https://doi.org/10.1103/PhysRevLett.108.076603

© 2012 American Physical Society

Authors & Affiliations

Doron Azulay, Isaac Balberg, and Oded Millo

  • Racah Institute of Physics and the Center for Nanoscience and Nanotechnology, The Hebrew University of Jerusalem, Jerusalem 91904, Israel

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Vol. 108, Iss. 7 — 17 February 2012

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