Antireflection Coating Using Metamaterials and Identification of Its Mechanism

Hou-Tong Chen, Jiangfeng Zhou, John F. O’Hara, Frank Chen, Abul K. Azad, and Antoinette J. Taylor
Phys. Rev. Lett. 105, 073901 – Published 9 August 2010; Erratum Phys. Rev. Lett. 106, 079902 (2011)

Abstract

We present a novel approach of antireflection coating using metamaterials. It dramatically reduces the reflection and greatly enhances the transmission near a specifically designed frequency over a wide range of incidence angles for both transverse magnetic and transverse electric polarizations. A classical interference mechanism is identified through analytical derivations and numerical simulations. It elucidates that the tailored magnitude and phase of waves reflected and transmitted at boundaries of metamaterial coating are responsible for the antireflection.

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  • Received 30 January 2010

DOI:https://doi.org/10.1103/PhysRevLett.105.073901

© 2010 The American Physical Society

Erratum

Erratum: Antireflection Coating Using Metamaterials and Identification of its Mechanism [Phys. Rev. Lett. 105, 073901 (2010)]

Hou-Tong Chen, Jiangfeng Zhou, John F. O’Hara, Frank Chen, Abul K. Azad, and Antoinette J. Taylor
Phys. Rev. Lett. 106, 079902 (2011)

Authors & Affiliations

Hou-Tong Chen*, Jiangfeng Zhou, John F. O’Hara, Frank Chen, Abul K. Azad, and Antoinette J. Taylor

  • MPA-CINT, MS K771, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA

  • *chenht@lanl.gov

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Issue

Vol. 105, Iss. 7 — 13 August 2010

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