Dynamics of exciton-hole recombination in hole-doped single-walled carbon nanotubes

Taishi Nishihara, Yasuhiro Yamada, and Yoshihiko Kanemitsu
Phys. Rev. B 86, 075449 – Published 22 August 2012

Abstract

The exciton decay dynamics in hole-doped single-walled carbon nanotubes (SWCNTs) has been studied by femtosecond pump-probe transient absorption (TA) spectroscopy. By the doping of SWCNTs with holes, a fast decay component with the lifetime of a few picoseconds appears in TA signals, which corresponds to exciton decay through the Auger recombination between an exciton and a hole and the trion formation. We revealed that this exciton decay rate is quantized by the number of holes in a single SWCNT. The number of holes of a hole-doped SWCNT is successfully evaluated on the basis of TA decay dynamics.

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  • Received 18 April 2012

DOI:https://doi.org/10.1103/PhysRevB.86.075449

©2012 American Physical Society

Authors & Affiliations

Taishi Nishihara, Yasuhiro Yamada, and Yoshihiko Kanemitsu*

  • Institute for Chemical Research, Kyoto University, Uji, Kyoto 611-0011, Japan

  • *Author to whom all correspondence should be addressed: kanemitu@scl.kyoto-u.ac.jp

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Issue

Vol. 86, Iss. 7 — 15 August 2012

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