Observation of electrochemical capacitance in a graphite surface by noncontact scanning nonlinear dielectric microscopy

Shin-ichiro Kobayashi and Yasuo Cho
Phys. Rev. B 82, 245427 – Published 30 December 2010

Abstract

We have developed a noncontact, scanning nonlinear dielectric microscopy (NC-SNDM) system operated under ultrahigh vacuum and have used it to observe the surface of graphite. By using the NC-SNDM technique (2ω amplitude feedback mode), we succeeded in obtaining clear SNDM images of the graphite surface. In the SNDM image patterns (inverted contrast ω amplitude image), a number of convex spots, with threefold symmetry, positioned at the corners of hexagons were observed when the probe tip was near the graphite surface. In contrast, a number of convex spots, with threefold symmetry, were also observed in the normal contrast ω amplitude image when the distance between the probe tip and graphite was large. Current images originating from tunneling were also observed in NC-SNDM and were similar to the ω amplitude images. Electrochemical capacitance between the probe tip and graphite surface with tunneling was introduced to investigate the origin of the SNDM signal. Applying this model to the NC-SNDM measurement, we found that the ω amplitude signal is dependent on the ratio of the slope of the local density of states (LDOS) and the energy curve, and the LDOS at the Fermi energy in the graphite surface. The convex spots and hollow spots in the hexagons on the graphite surface also originate from the LDOS in the NC-SNDM measurements. This means that the SNDM signal for the graphite surface reflects the LDOS on the graphite surface. Considering the relationship between the ω amplitude signal and LDOS on the graphite surface, the current signal observed in the NC-SNDM measurement originates from the tunneling effect between the probe tip and graphite surface. The proposed technique can potentially detect not only a unique carbon surface but also organic molecules on a metallic surface.

  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
11 More
  • Received 1 June 2010

DOI:https://doi.org/10.1103/PhysRevB.82.245427

©2010 The American Physical Society

Authors & Affiliations

Shin-ichiro Kobayashi* and Yasuo Cho

  • Research Institute of Electrical Communication, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan

  • *kshin@atom.che.tohoku.ac.jp

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 82, Iss. 24 — 15 December 2010

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×