Interplane penetration depth and coherent transport in organic superconductors

Tyson A. Olheiser, Zane Shi, David D. Lawrie, Russell W. Giannetta, and John A. Schlueter
Phys. Rev. B 80, 054519 – Published 27 August 2009

Abstract

Measurements of the interlayer penetration depth λ have been performed on single crystals of the organic superconductors κ(ET)2Cu[N(CN)2]Br and κ(ET)2Cu(NCS)2. We find that λ(0)130μm for both materials. The normalized superfluid density ρ=[λ(0)/λ(T)]2 may be fit equally well to a power law 1ρTn with n=1.31.5 or to the form 1ρ=α(T2/TC)/(T+T), consistent with a d-wave pairing state with impurity scattering. The data imply coherent transport between conducting planes, in agreement with recent magnetoresistive measurements [J. Singleton, P. A. Goddard, A. Ardavan, N. Harrison, S. J. Blundell, J. A. Schlueter, and A. M. Kini, Phys. Rev. Lett. 88, 037001 (2002)] and in contrast to the copper oxides.

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  • Received 6 May 2009

DOI:https://doi.org/10.1103/PhysRevB.80.054519

©2009 American Physical Society

Authors & Affiliations

Tyson A. Olheiser, Zane Shi*, David D. Lawrie, and Russell W. Giannetta

  • Loomis Laboratory of Physics, University of Illinois at Urbana–Champaign, Urbana, Illinois 61801, USA

John A. Schlueter

  • Chemistry and Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA

  • *Present address: Dept. of Physics, Princeton University, Princeton, NJ 08540, USA.
  • Present address: Dept. of Biological Sciences, University of Alberta, Edmonton, AB, Canada T6G 2E9.
  • Corresponding author; russg@illinois.edu

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Issue

Vol. 80, Iss. 5 — 1 August 2009

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