Reply to “Comment on ‘Low-temperature phonon thermal conductivity of single-crystalline Nd2CuO4: Effects of sample size and surface roughness’ ”

S. Y. Li, J.-B. Bonnemaison, A. Payeur, P. Fournier, C. H. Wang, X. H. Chen, and Louis Taillefer
Phys. Rev. B 79, 176502 – Published 1 May 2009

Abstract

In their comment [X. F. Sun and Yoichi Ando, preceding paper, Phys. Rev. B79, 176501 (2009)] on our study of phonon heat transport in Nd2CuO4 [S. Y. Li, J.-B. Bonnemaison, A. Payeur, P. Fournier, C. H. Wang, X. H. Chen, and Louis Taillefer, Phys. Rev. B 77, 134501 (2008)], Sun and Ando estimate that the phonon mean free path at low temperature is roughly half the width of the single crystal used in our study, from which they argue that phonon scattering cannot be dominated by sample boundaries. Here we show that their use of specific-heat data on Nd2CuO4, which contains a large magnetic contribution at low temperature that is difficult to reliably extract, leads to an underestimate of the mean free path by a factor 2 compared to an estimate based on the specific-heat data of the nonmagnetic isostructural analog Pr2CuO4. This removes the apparent contradiction raised by Sun and Ando.

  • Received 20 November 2008

DOI:https://doi.org/10.1103/PhysRevB.79.176502

©2009 American Physical Society

Authors & Affiliations

S. Y. Li1, J.-B. Bonnemaison1, A. Payeur1, P. Fournier1,2, C. H. Wang3, X. H. Chen3, and Louis Taillefer1,2,*

  • 1Département de Physique and RQMP, Université de Sherbrooke, Sherbrooke, Canada J1K 2R1
  • 2Canadian Institute for Advanced Research, Toronto, Canada M5G 1Z8
  • 3Hefei National Laboratory for Physical Science at Microscale and Department of Physics, University of Science and Technology of China, Hefei, Anhui 230026, People’s Republic of China

  • *louis.taillefer@physique.usherbrooke.ca

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Original Article

Low-temperature phonon thermal conductivity of single-crystalline Nd2CuO4: Effects of sample size and surface roughness

S. Y. Li, J.-B. Bonnemaison, A. Payeur, P. Fournier, C. H. Wang, X. H. Chen, and Louis Taillefer
Phys. Rev. B 77, 134501 (2008)

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Vol. 79, Iss. 17 — 1 May 2009

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