Interpretation of Coulomb oscillations in carbon-nanotube-based field-effect transistors

Hong Li, Qing Zhang, and Jingqi Li
Phys. Rev. B 73, 235431 – Published 27 June 2006

Abstract

Bias-voltage and temperature-dependent Coulomb oscillations are demonstrated in long-channel (1500nm) single-walled carbon-nanotube-based field-effect transistors. The oscillation peaks disappear gradually with increasing temperatures up to 70K. Diamond-shaped channel current suppression regions are observed at 15K when the current is plotted with contour lines in the gate voltage versus source-drain voltage plane. Interestingly, these characteristics are only found in one kind of carbon-nanotube-based field-effect transistors, in which a long single-walled carbon-nanotube bundle bridges the source/drain electrodes, while several short single-walled carbon-nanotube bundles are attached to the source/drain contacts. The long-tube channel may act as an electrometer to detect single-charge charging signals in the short single-walled carbon nanotubes. On one hand, charges trapped in the short tubes could be quantized due to the Coulomb blockade. On the other hand, the electrostatic potential at the long-tube/electrodes contacts could be influenced by the quantum charges stored in the short single-walled carbon nanotubes so that the channel current is modulated.

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  • Received 29 November 2005

DOI:https://doi.org/10.1103/PhysRevB.73.235431

©2006 American Physical Society

Authors & Affiliations

Hong Li, Qing Zhang*, and Jingqi Li

  • Microelectronics Center, School of Electrical and Electronics Engineering, Nanyang Technological University, S1-B2c-20, Singapore 639798

  • *Corresponding author. Email address: eqzhang@ntu.edu.sg

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Issue

Vol. 73, Iss. 23 — 15 June 2006

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