Characterization of Eδ and triplet point defects in oxygen-deficient amorphous silicon dioxide

G. Buscarino, S. Agnello, and F. M. Gelardi
Phys. Rev. B 73, 045208 – Published 27 January 2006

Abstract

We report an experimental study by electron paramagnetic resonance (EPR) of γ-ray irradiation induced point defects in oxygen deficient amorphous SiO2 materials. We have found that three intrinsic (Eγ, Eδ, and triplet) and one extrinsic ([AlO4]0) paramagnetic centers are induced. All the paramagnetic defects but Eγ center are found to reach a concentration limit value for doses above 103kGy, suggesting a generation process from precursors. Isochronal thermal treatments of a sample irradiated at 103kGy have shown that for T500K the concentrations of Eγ and Eδ centers increase concomitantly to the decrease of [AlO4]0. This occurrence speaks for a hole transfer process from [AlO4]0 centers to diamagnetic precursors of E centers proving the positive charge state of the thermally induced Eγ and Eδ centers and giving insight on the origin of Eγ from an oxygen vacancy. A comparative study of the Eδ center and of the 10mT doublet EPR signals on three distinct materials subjected to isochronal and isothermal treatments has shown a quite general linear correlation between these two EPR signals. This result confirms the attribution of the 10mT doublet to the hyperfine structure of the Eδ center, originating from the interaction of the unpaired electron with a nucleus of Si29 (I=12). Analogies between the microwave saturation properties of Eγ and Eδ centers and between those of their hyperfine structures are found and suggest that the unpaired electron wave function involves similar Si sp3 hybrid orbitals; specifically, for the Eδ the unpaired electron is supposed to be delocalized over four such orbitals of four equivalent Si atoms. Information on the structural model of the triplet center are also obtained indicating that it could consist of the same microscopic structure as the Eδ but for a doubly ionized state.

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  • Received 19 May 2005

DOI:https://doi.org/10.1103/PhysRevB.73.045208

©2006 American Physical Society

Authors & Affiliations

G. Buscarino*, S. Agnello, and F. M. Gelardi

  • Department of Physical and Astronomical Sciences, University of Palermo, Via Archirafi 36, I-90123 Palermo, Italy

  • *Email address: buscarin@fisica.unipa.it

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Vol. 73, Iss. 4 — 15 January 2006

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