Abstract
We analyze current-voltage characteristics taken on Au-doped indium-oxide films. By fitting a scaling function to the data, we extract the electron-phonon scattering rate as function of temperature. Consistently good fits are obtained for both short-sample and long-sample limits using data of the same material. The fitting implies a quadratic dependence of the electron-phonon scattering rate on temperature from 1 down to . The origin of this enhanced electron-phonon scattering rate is ascribed to the mechanism proposed by Sergeev and Mitin.
- Received 24 May 2005
DOI:https://doi.org/10.1103/PhysRevB.72.245104
©2005 American Physical Society