Comment on “Molecular-dynamics simulations of solid-phase epitaxy of Si: Growth mechanisms”

Manabu Ishimaru
Phys. Rev. B 63, 237401 – Published 11 May 2001
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Abstract

Based on molecular-dynamics simulations using the Tersoff interatomic potential, Motooka et al. recently proposed an atomistic model for solid-phase epitaxial (SPE) growth onto a Si(001) substrate [Phys. Rev. B 61, 8537 (2000)]. In their model, the SPE growth mode and its activation energy are different in the lower (1450–1600 K) and higher temperature (1600–2000 K) regions. In this Comment, we show that the amorphous-to-liquid phase transition occurs above 1650 K, so Motooka’s simulations do not reproduce the SPE processes at higher temperature.

  • Received 18 May 2000

DOI:https://doi.org/10.1103/PhysRevB.63.237401

©2001 American Physical Society

Authors & Affiliations

Manabu Ishimaru

  • The Institute of Scientific and Industrial Research, Osaka University, Mihogaoka, Ibaraki, Osaka 567-0047, Japan

Comments & Replies

Reply to “Comment on ‘Molecular-dynamics simulations of solid-phase epitaxy of Si: Growth mechanisms’ ”

Teruaki Motooka, Ken Nishihira, Shinji Munetoh, Koji Moriguchi, and Akira Shintani
Phys. Rev. B 63, 237402 (2001)

Original Article

Molecular-dynamics simulations of solid-phase epitaxy of Si: Growth mechanisms

T. Motooka, K. Nisihira, S. Munetoh, K. Moriguchi, and A. Shintani
Phys. Rev. B 61, 8537 (2000)

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Vol. 63, Iss. 23 — 15 June 2001

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