Oxidation mechanism of LaTiO3.5 thin films

J. W. Seo, J. Fompeyrine, H. Siegwart, and J.-P. Locquet
Phys. Rev. B 63, 205401 – Published 12 April 2001
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Abstract

LaTiO3.5 is a layered compound made up of four LaTiO3 units: two regular perovskite units stacked between two distorted units that share an additional oxygen layer. In a single-crystalline thin film the (100) plane can be aligned parallel to the substrate surface, i.e., the additional oxygen layers are inserted parallel to the substrate surface. A detailed structural characterization reveals planar defects originating from substrate surface steps. These results, in combination with the in situ reflection high-energy electron-diffraction observations, suggest an oxidation mechanism using such antiphase boundaries as oxidation paths.

  • Received 31 October 2000

DOI:https://doi.org/10.1103/PhysRevB.63.205401

©2001 American Physical Society

Authors & Affiliations

J. W. Seo1,2, J. Fompeyrine2, H. Siegwart2, and J.-P. Locquet2

  • 1Institut de Physique, Université de Neuchâtel, CH-2000 Neuchâtel, Switzerland
  • 2IBM Research, Zurich Research Laboratory, CH-8803 Rüschlikon, Switzerland

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Vol. 63, Iss. 20 — 15 May 2001

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