Composition-dependent layered structure and transport properties in BiTe thin films

Yunki Kim, Sunglae Cho, Antonio DiVenere, George K. L. Wong, and J. B. Ketterson
Phys. Rev. B 63, 155306 – Published 26 March 2001
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Abstract

We have studied the compositional dependence of the layered structure of Bi1+xTe1x thin films and its relation with the transport properties. We have observed that the Bi1+xTe1x films have a stable structure near the Bi1Te1 composition and that their crystallinity depends strongly upon the compositional deviation from stoichiometric Bi1Te1. We have determined possible layered structures, configured with two sequences of Bi–Bi and Te–Bi–Te–Bi–Te, corresponding to Bi and Te binary compositions using x-ray diffraction analysis. Their c-axis lattice constants were in the range of 36 Å and 136 Å. Temperature-dependent thermopowers of the films reveal that as the composition changes from Te rich to Bi rich, the polarity varies from n type to p type.

  • Received 20 September 1999

DOI:https://doi.org/10.1103/PhysRevB.63.155306

©2001 American Physical Society

Authors & Affiliations

Yunki Kim, Sunglae Cho*, Antonio DiVenere, George K. L. Wong, and J. B. Ketterson

  • Department of Physics and Astronomy, Northwestern University, Evanston, Illinois 60208

  • *Permanent address: Department of Physics, University of Ulsan, Ulsan, South Korea.
  • Permanent address: Physics department, HKUST, Clearwater Bay, Kowloon, Hong Kong, China.
  • Also at Department of Electrical and Computer Engineering, Northwestern University, Evanston, Illinois 60208.

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Vol. 63, Iss. 15 — 15 April 2001

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