Abstract
We have studied the compositional dependence of the layered structure of thin films and its relation with the transport properties. We have observed that the films have a stable structure near the composition and that their crystallinity depends strongly upon the compositional deviation from stoichiometric We have determined possible layered structures, configured with two sequences of Bi–Bi and Te–Bi–Te–Bi–Te, corresponding to Bi and Te binary compositions using x-ray diffraction analysis. Their c-axis lattice constants were in the range of 36 Å and 136 Å. Temperature-dependent thermopowers of the films reveal that as the composition changes from Te rich to Bi rich, the polarity varies from n type to p type.
- Received 20 September 1999
DOI:https://doi.org/10.1103/PhysRevB.63.155306
©2001 American Physical Society