Microphotoluminescence spectroscopy of vertically stacked InxGa1xAs/GaAs quantum wires

R. Cingolani, F. Sogawa, Y. Arakawa, R. Rinaldi, M. DeVittorio, A. Passaseo, A. Taurino, M. Catalano, and L. Vasanelli
Phys. Rev. B 58, 1962 – Published 15 July 1998
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Abstract

Disorder and spectral broadening of vertically stacked InGaAs/GaAs V-grooved quantum wires have been investigated by means of microprobe luminescence. We show that the main spectral broadening mechanism originates from monolayer fluctuations at the bottom of the wire. A direct evidence of monolayer height islands of area 40×40nm formed at the bottom of the grooves is provided by atomic force microscopy. Lateral and vertical wire-to-wire fluctuations are found to be negligible on the micron scale.

  • Received 19 February 1998

DOI:https://doi.org/10.1103/PhysRevB.58.1962

©1998 American Physical Society

Authors & Affiliations

R. Cingolani*, F. Sogawa, and Y. Arakawa

  • Institute of Industrial Science, University of Tokyo, Japan

R. Rinaldi, M. DeVittorio, and A. Passaseo

  • Unità INFM, Department of Material Science, University of Lecce, 73100 Lecce, Italy

A. Taurino, M. Catalano, and L. Vasanelli

  • Consiglio Nazionale delle Ricerche, Istituto CNR-IME, c/o Department of Material Science, University of Lecce, 73100 Lecce, Italy

  • *Permanent address: Unità INFM, Dept. Material Science, University of Lecce, Italy.

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Vol. 58, Iss. 4 — 15 July 1998

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