Optical-phonon behavior in Ga1xInxAs: The role of microscopic strains and ionic plasmon coupling

J. Groenen, R. Carles, G. Landa, C. Guerret-Piécourt, C. Fontaine, and M. Gendry
Phys. Rev. B 58, 10452 – Published 15 October 1998
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Abstract

We present an experimental and theoretical investigation of long-wavelength optical-phonon behavior in Ga1xInxAs alloys. We propose a model which accounts quantitatively for both phonon frequencies and Raman intensities. The transverse-optical-phonon behavior is shown to be determined by mass disorder and microscopic strains. It is shown that Raman scattering provides a means of measuring local bond distortions in mixed crystals. Coupling by the macroscopic ionic polarization is shown to determine the longitudinal optical-phonon behavior. The model accounts for the so-called anomalies of the Raman intensities and oscillator strengths observed in Ga1xInxAs. Our analysis is supported by a thorough Raman-scattering study. The frequencies, Raman intensities and symmetries of both the transverse- and longitudinal-optical modes have been determined accurately over the whole compositional range, by using different crystal orientations ([001], [110], and [111]).

  • Received 22 May 1998

DOI:https://doi.org/10.1103/PhysRevB.58.10452

©1998 American Physical Society

Authors & Affiliations

J. Groenen, R. Carles, and G. Landa

  • Laboratoire de Physique des Solides, Université P. Sabatier, 118 route de Narbonne, 31062 Toulouse Cedex 4, France

C. Guerret-Piécourt and C. Fontaine

  • Laboratoire d’Architecture et d’Analyse des Systèmes, Avenue E. Belin, 31077 Toulouse Cedex 4, France

M. Gendry

  • Ecole Centrale de Lyon, Laboratoire d’électronique, LEAME, Boîte Postale 163, 69131 Ecully Cedex, France

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Vol. 58, Iss. 16 — 15 October 1998

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