Abstract
Properties of a resonance mode, the existence of which is related to the amorphous structure, are reported. This mode, in addition to the uniform mode, was observed in (R (R=Pr, Nd, Dy, Tb) amorphous thin films possessing an in-plane uniaxial anisotropy field . A study as a function of the working frequency shows that when the magnetic field H is applied in the plane defined by the film normal and , the mode can be identified as a longitudinal resonance, so detected even for H∥∥. The mode is localized and this localization is 'stronger' for higher working frequencies so that the resonance fields are higher.
DOI:https://doi.org/10.1103/PhysRevB.55.11076
©1997 American Physical Society