Electronic effects in scanning tunneling microscopy: Moiré pattern on a graphite surface

Zhao Y. Rong and Pieter Kuiper
Phys. Rev. B 48, 17427 – Published 15 December 1993
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Abstract

We observed by scanning tunneling microscopy (STM) a hexagonal superlattice on graphite with a period of 66 Å. Direct measurement of the angle between lattice vectors confirmed that the superlattice is a Moiré pattern caused by a 2.1° rotation of the topmost (0001) plane with respect to the bulk. The STM corrugation of 2.6 Å is not due to physical buckling, but to differences in electronic structure between AA-stacked, normal AB-stacked, and rhombohedral CAB-stacked graphite. The high tunneling current of AA-stacked regions is in agreement with the high density of states at the Fermi level calculated for AA graphite. The Moiré pattern changes, both the amplitude and the shape, with bias voltage. The observation provides a basis for a comparative study of surface electronic structures with different subsurface layer configuration, which is a vital test of our understanding of STM.

  • Received 27 July 1993

DOI:https://doi.org/10.1103/PhysRevB.48.17427

©1993 American Physical Society

Authors & Affiliations

Zhao Y. Rong and Pieter Kuiper

  • Physics Department, Brookhaven National Laboratory, Upton, New York 11973

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Issue

Vol. 48, Iss. 23 — 15 December 1993

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