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Prevention of crystallization by surfactants during Si molecular-beam deposition on amorphous-Si films

Akira Sakai, Toru Tatsumi, and Koichi Ishida
Phys. Rev. B 47, 6803(R) – Published 15 March 1993
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Abstract

We have investigated the effect of Sb surfactants on the crystallization of Si adatoms on the amorphous-Si (a-Si) surface during Si molecular-beam deposition. It was observed that the Sb segregated to the surface and prevented crystallization, resulting in a-Si formation even at around 600 °C. Comparison of the grain growth modes on the a-Si surface with and without the surfactant clearly shows the reduction of the diffusion length of the surface-free adatoms by the surfactant.

  • Received 17 December 1992

DOI:https://doi.org/10.1103/PhysRevB.47.6803

©1993 American Physical Society

Authors & Affiliations

Akira Sakai, Toru Tatsumi, and Koichi Ishida

  • Microelectronics Research Laboratories, NEC Corporation, 34 Miyukigaoka, Tsukuba, Ibaraki 305, Japan

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Vol. 47, Iss. 11 — 15 March 1993

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