Piezo-optics of GaAs

P. Etchegoin, J. Kircher, M. Cardona, C. Grein, and E. Bustarret
Phys. Rev. B 46, 15139 – Published 15 December 1992
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Abstract

We have obtained the three independent complex components P11(ω), P12(ω), and P44(ω) of the linear piezo-optical tensor Pijkl(ω) [Δεij(ω)=Pijkl(ω)Xkl] of GaAs in the ∼1.5–5.4-eV photon-energy range (visible UV) by applying static uniaxial stress (X) along the high-symmetry directions [100] and [111] and measuring the stress-induced changes in the dielectric function ε(ω). These measurements were performed using a conventional rotating analyzer ellipsometer at room temperature. The measured components of the piezo-optical tensor are in agreement with prior Kramers-Kronig analysis of piezoreflectance data. Each component of Pijkl(ω) is also compared with band-structure-based calculations performed with the empirical pseudopotential method. The calculations are in reasonable agreement with the experiment. Improved deformation-potential constants D11, D15, D33, and D35 for the E1-E1+Δ1 transitions were also obtained from an analysis of the ellipsometric data. They compare favorably with theoretical estimates. In particular, the experimental value of D35 agrees rather well with band-structure-based calculations, in contrast with previous measurements of this parameter.

  • Received 23 July 1992

DOI:https://doi.org/10.1103/PhysRevB.46.15139

©1992 American Physical Society

Authors & Affiliations

P. Etchegoin, J. Kircher, M. Cardona, C. Grein, and E. Bustarret

  • Max-Planck-Institut für Festkörperforschung, Heisenbergstrasse 1, D-7000 Stuttgart 80, Germany

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Vol. 46, Iss. 23 — 15 December 1992

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