Lateral displacement of Bragg-reflected x-ray beams

Rhoda Berenson
Phys. Rev. B 40, 20 – Published 1 July 1989
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Abstract

In the usual treatment of the dynamical diffraction of x rays, one considers a plane wave which is incident on a crystal giving rise to a reflected plane wave. This work extends that theory by considering an incident bounded beam of x rays. We evaluate the resulting Bragg-reflected beam for both symmetric and asymmetric reflections and show that the reflected beam undergoes a lateral shift and that incidence at the edges of the range of total reflection results in a lateral wave traveling along the surface. This is analagous to the Goos-Hanchen effect for total internal reflection of an optical beam. In addition, if the incident beam is spectrally wide, the reflected beam is distorted and broadened, as well as shifted.

  • Received 23 January 1989

DOI:https://doi.org/10.1103/PhysRevB.40.20

©1989 American Physical Society

Authors & Affiliations

Rhoda Berenson

  • Department of Physics, Nassau Community College, Garden City, New York 11530

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Issue

Vol. 40, Iss. 1 — 1 July 1989

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