Critical currents in sputtered Nb-Ta multilayers

P. R. Broussard and T. H. Geballe
Phys. Rev. B 37, 68 – Published 1 January 1988
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Abstract

Critical-current measurements have been made on sputtered Nb-Ta multilayers for both perpendicular and parallel applied field. For large bilayer periods, the pinning force behaves as h(1-h) and is due to dislocation pinning. As the bilayer period decreases, the pinning force decreases and changes over to a collective mechanism. For parallel applied field, there is a lack of temperature scaling and an increase in the pinning force, which is due to pinning by the multilayering. A search for the existence of other effects is discussed.

  • Received 7 August 1987

DOI:https://doi.org/10.1103/PhysRevB.37.68

©1988 American Physical Society

Authors & Affiliations

P. R. Broussard

  • Naval Research Laboratory, Washington, D.C. 20375-5000

T. H. Geballe

  • Department of Applied Physics, Stanford University, Stanford, California 94305

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Vol. 37, Iss. 1 — 1 January 1988

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