Band-gap tailoring of ZnO by means of heavy Al doping

B. E. Sernelius, K.-F. Berggren, Z.-C. Jin, I. Hamberg, and C. G. Granqvist
Phys. Rev. B 37, 10244 – Published 15 June 1988
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Abstract

Films of ZnO:Al were produced by weakly reactive dual-target magnetron sputtering. Optical band gaps, evaluated from spectrophotometric data, were widened in proportion to the Al doping. The widening could be quantitatively reconciled with an effective-mass model for n-doped semiconductors, provided the polar character of ZnO was accounted for.

  • Received 30 November 1987

DOI:https://doi.org/10.1103/PhysRevB.37.10244

©1988 American Physical Society

Authors & Affiliations

B. E. Sernelius

  • Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
  • Department of Physics, University of Tennessee, Knoxville, Tennessee 37996

K.-F. Berggren

  • Theoretical Physics Group, Department of Physics and Measurement Technology, Linköping University, S-581–83 Linköping, Sweden

Z.-C. Jin, I. Hamberg, and C. G. Granqvist

  • Physics Department, Chalmers University of Technology, S-41296 Gothenburg, Sweden

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Vol. 37, Iss. 17 — 15 June 1988

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