Abstract
Films of ZnO:Al were produced by weakly reactive dual-target magnetron sputtering. Optical band gaps, evaluated from spectrophotometric data, were widened in proportion to the Al doping. The widening could be quantitatively reconciled with an effective-mass model for n-doped semiconductors, provided the polar character of ZnO was accounted for.
- Received 30 November 1987
DOI:https://doi.org/10.1103/PhysRevB.37.10244
©1988 American Physical Society