Reduction of charge-center scattering rate in Hg1xFexSe

F. S. Pool, J. Kossut, U. Debska, and R. Reifenberger
Phys. Rev. B 35, 3900 – Published 15 March 1987
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Abstract

The electrical resistivity, electron concentration, and mobility of Hg1xFexSe are reported for 4.2<T<300 K and for 0.0001<x<0.12. The data are interpreted within an electronic band-structure model that assumes the existence of resonant donors (due to the presence of Fe ions) whose ground-state energy coincides with the conduction-band continuum. The electron-concentration data enable determination of the donor energy as a function of the temperature and crystal composition. Unexpectedly high values of the low-temperature electron mobility for ∼0.0003≤x≤0.01 indicate a reduction of the charged-impurity scattering rate at these temperatures. This effect is interpreted in terms of a spatial ordering of charges within the Fe-related impurity system.

  • Received 3 October 1986

DOI:https://doi.org/10.1103/PhysRevB.35.3900

©1987 American Physical Society

Authors & Affiliations

F. S. Pool, J. Kossut, U. Debska, and R. Reifenberger

  • Department of Physics, Purdue University, W. Lafayette, Indiana 47907

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Issue

Vol. 35, Iss. 8 — 15 March 1987

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