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Light scattering determination of band offsets in GaAsAlxGa1xAs quantum wells

J. Menéndez, A. Pinczuk, D. J. Werder, A. C. Gossard, and J. H. English
Phys. Rev. B 33, 8863(R) – Published 15 June 1986
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Abstract

The conduction-band offset in GaAsAlxGa1xAs quantum wells is determined with a new light scattering method. A value of ΔEcΔEg=Qe=0.69 is found for x0.06. The conduction-band discontinuity ΔEc is obtained from electronic light scattering in a photoexcited sample. The total gap discontinuity ΔEg is deduced from resonance Raman scattering by AlxGa1xAs phonons in the same sample. The light scattering method is unique because ΔEc can be determined regardless of the valence-band structure or exciton binding energies. It also allows a direct measurement of ΔEg, so that an exact knowledge of the alloy composition in AlxGa1xAs is no longer needed.

  • Received 27 February 1986

DOI:https://doi.org/10.1103/PhysRevB.33.8863

©1986 American Physical Society

Authors & Affiliations

J. Menéndez, A. Pinczuk, D. J. Werder, A. C. Gossard, and J. H. English

  • AT&T Bell Laboratories, Murray Hill, New Jersey 07974

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Vol. 33, Iss. 12 — 15 June 1986

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