A theoretical model of mobility fluctuations that has a $\frac{1}{f}$ power spectrum in electric-current-conducting materials and devices is presented. The theory traces the origin of the $\frac{1}{f}$ noise to some rather uncommon electronic or ionic energy structure and excitations which have been identified earlier to be responsible for the remarkable universal dielectric-response behavior of condensed matter. The relation between the ubiquitous $\frac{1}{f}$ noise and the universal $\frac{1}{{\omega }^{1-n}}$ low-frequency dielectric response in current-conducting material is pointed out and emphasized. We have thus a unified theory explaining on the same basis both physical phenomena with a single physical picture.

• Received 14 March 1980

DOI:https://doi.org/10.1103/PhysRevB.22.2066