Excitonic Probe for Characterization of High-Quality Quantum-Well Heterostructures

P. Yu. Shapochkin, S.A. Eliseev, V.A. Lovtcius, Yu. P. Efimov, P.S. Grigoryev, E.S. Khramtsov, and I.V. Ignatiev
Phys. Rev. Applied 12, 034034 – Published 17 September 2019

Abstract

High-quality GaAs/(Al,Ga)As heterostructures with quantum wells grown by molecular-beam-epitaxy technology are experimentally studied by means of optical spectroscopy of exciton states. The exciton resonances observed in the reflectance spectra are analyzed in the framework of phenomenological and microscopic models. The exciton energies, the radiative (Γ0) and nonradiative (Γ) broadening, and the phases of resonant reflection are obtained from the modeling for each exciton resonance. These parameters are used for careful analysis of the parameters and quality of the structures. Particular attention is paid to the exciton energies and phases, which are used to determine the quantum-well and barrier-layer thicknesses with high accuracy.

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  • Received 30 April 2019
  • Revised 10 July 2019

DOI:https://doi.org/10.1103/PhysRevApplied.12.034034

© 2019 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

P. Yu. Shapochkin1, S.A. Eliseev1, V.A. Lovtcius1, Yu. P. Efimov1, P.S. Grigoryev2,*, E.S. Khramtsov2, and I.V. Ignatiev2

  • 1Department of Physics, St. Petersburg State University, Ulyanovskaya 1, Petrodvorets, St. Petersburg 198504, Russia
  • 2Spin Optics Laboratory, St. Petersburg State University, Ulyanovskaya 1, Petrodvorets, St. Petersburg 198504, Russia

  • *philipp0grigoriev@gmail.com

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Vol. 12, Iss. 3 — September 2019

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