High-energy charged particle radiography has been used for diagnostics of high-energy density matter, and electrons can serve as a promising radiographic probe that acts as a complement to commonly used proton probes. Here we report on an electron radiography experiment using 45 MeV electrons from an S-band photoinjector, where scattered electrons, after interacting with a sample, are collected and imaged by a quadrupole imaging system. We achieve a spatial resolution of a few microns ($\sim 4\mu \mathrm{m}$) and a thickness resolution of a few percent for a silicon target of $300–600\mu \mathrm{m}$ in thickness. With additional dark-field images captured by selecting electrons with large scattering angles, we show that complementary information for determining external details such as outlines, boundaries and defects can be obtained.

• Received 4 May 2017

DOI:https://doi.org/10.1103/PhysRevAccelBeams.21.074701

Published by the American Physical Society under the terms of the Creative Commons Attribution 4.0 International license. Further distribution of this work must maintain attribution to the author(s) and the published article’s title, journal citation, and DOI.

Published by the American Physical Society