In parametric-resonance magnetometers (PRMs), optically pumped atoms subject to rf fields allow one to measure the components of a very low magnetic field. Here, instead of using a circularly polarized light for creating atomic orientation, as in previous works, a linearly polarized light is used for creating atomic alignment. A dressed-atom formalism introduced by Polonsky and Cohen-Tannoudji is extended and allows one to map this situation to a simpler Hanle effect on aligned atoms. Analytical expressions for all alignment tensor components and photodetection signals are obtained for both the Hanle magnetometer and PRMs. A two-rf field alignment PRM is shown to display several improvements from its orientation counterpart, providing a secular third axis sensitivity and a lower degradation from the one-axis sensitivity obtained by using a single rf field. These specificities are shown to result from the apparent depolarization of the pumping light acting on the atom dressed by two-rf fields. Experimental measurements showing a good agreement with the theoretical predictions are presented.

• Received 6 August 2018

DOI:https://doi.org/10.1103/PhysRevA.98.053431