Measurement of the radiative lifetime of the A2Σ(v=0) state of SiF

S. J. Davis and S. G. Hadley
Phys. Rev. A 14, 1146 – Published 1 September 1976
PDFExport Citation

Abstract

We report a measurement of the A2Σ(v=0) radiative lifetime in silicon monofluoride. In this experiment, SiF radicals were produced by the microwave discharge of SiF4. The ground-state SiF molecules were then excited to the A2Σ(v=0) state by a dye-laser pulse. The resultant fluorescence was recorded and its decay rate measured. The measured lifetime was 0.23 ± 0.02 μsec and was independent of SiF4 pressure in the range 0.05 to 1.0 Torr.

  • Received 5 April 1976

DOI:https://doi.org/10.1103/PhysRevA.14.1146

©1976 American Physical Society

Authors & Affiliations

S. J. Davis and S. G. Hadley

  • Air Force Weapons Laboratory, Kirtland Air Force Base, Albuquerque, New Mexico 87117

References (Subscription Required)

Click to Expand
Issue

Vol. 14, Iss. 3 — September 1976

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review A

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×