Angle-robust two-qubit gates in a linear ion crystal

Zhubing Jia, Shilin Huang, Mingyu Kang, Ke Sun, Robert F. Spivey, Jungsang Kim, and Kenneth R. Brown
Phys. Rev. A 107, 032617 – Published 23 March 2023

Abstract

In trapped-ion quantum computers, two-qubit entangling gates are generated by applying spin-dependent force which uses phonons to mediate interaction between the internal states of the ions. To maintain high-fidelity two-qubit gates under fluctuating experimental parameters, robust pulse-design methods are applied to remove the residual spin-motion entanglement in the presence of motional mode-frequency drifts. Here we propose an improved pulse-design method that also guarantees the robustness of the two-qubit rotation angle against uniform mode-frequency drifts by concatenating pulses with opposite sensitivity of the angle to mode-frequency drifts. We experimentally verify significantly improved robustness of the rotation angle against uniform mode-frequency drifts, as well as observe an improvement in gate fidelity from 97.84(10)% to 98.11(11)%, compared to a single frequency-modulated pulse.

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  • Received 10 November 2022
  • Accepted 8 March 2023

DOI:https://doi.org/10.1103/PhysRevA.107.032617

©2023 American Physical Society

Physics Subject Headings (PhySH)

Quantum Information, Science & Technology

Authors & Affiliations

Zhubing Jia1,2,*, Shilin Huang1,3, Mingyu Kang1,2, Ke Sun1,2, Robert F. Spivey1,3, Jungsang Kim1,2,3,4, and Kenneth R. Brown1,2,3,5,†

  • 1Duke Quantum Center, Duke University, Durham, North Carolina 27701, USA
  • 2Department of Physics, Duke University, Durham, North Carolina 27708, USA
  • 3Department of Electrical and Computer Engineering, Duke University, Durham, North Carolina 27708, USA
  • 4IonQ, Inc., College Park, Maryland 20740, USA
  • 5Department of Chemistry, Duke University, Durham, North Carolina 27708, USA

  • *Present address: Department of Physics, The University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA; zjia11@illinois.edu
  • kenneth.r.brown@duke.edu

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Issue

Vol. 107, Iss. 3 — March 2023

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