Size Effect on Phonon Drag in Platinum

R. P. Huebener
Phys. Rev. 140, A1834 – Published 29 November 1965
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Abstract

Thermoelectric measurements with thermocouples consisting of thin platinum foils and 0.254-mm-diam platinum wire have been carried out between 4.2 and 310°K. The thickness of the foils was 1.6×103 to 8×103 mm. The difference ΔS between the thermoelectric power of the foils and the wire was separated into the electronic component ΔSe, caused by the electron scattering at the crystal surface, and the phonondrag component ΔSg, resulting from the phonon scattering at the crystal surface. From the phonon-drag component ΔSg the phonon mean free path λ0 in the bulk material was determined as a function of the temperature. Above 60°K (approximately the temperature of the phonon-drag peak) the relation λ0=(1.1×105)e64°K/T mm was found, in agreement with the expectation that in this temperature range λ0 is mainly limited by phonon-phonon umklapp processes. The pre-exponential factor in λ0 is within a factor of two in agreement with the value calculated from Klemens's theory. From the electronic component ΔSe, the derivative of the electron mean free path l with respect to the electron energy E was found to be {lnlE}EF=3.4±0.8 (eV)1. Measurements of the electrical-resistivity difference between the foils and the wire yielded for the electron mean free path in platinum the value l=(6.4±1.0)×107 cm at 296°K.

  • Received 7 July 1965

DOI:https://doi.org/10.1103/PhysRev.140.A1834

©1965 American Physical Society

Authors & Affiliations

R. P. Huebener

  • Argonne National Laboratory, Argonne, Illinois

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Issue

Vol. 140, Iss. 5A — November 1965

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