Disorder-Induced Degradation of Vertical Carrier Transport in Strain-Balanced Antimony-Based Superlattices

E. Bellotti, F. Bertazzi, A. Tibaldi, J. Schuster, J. Bajaj, and M. Reed
Phys. Rev. Applied 16, 054028 – Published 15 November 2021

Abstract

We investigate carrier transport in gallium-free strained-balanced InAs/InxAs1xSb type-II superlattices in the presence of positional and compositional disorder. We use a rigorous nonequilibrium Green’s function model based on fully nonlocal scattering self-energies computed in the self-consistent Born approximation and a multiband description of the electronic structure. Layer-thickness fluctuations, nonuniform antimony composition, and segregation throughout the superlattice stack lead to as-grown disordered structures that are quite different from the abrupt interface ideal superlattices. We find that regardless of its nature and cause, disorder significantly affects vertical-carrier-transport properties, by impeding the coherent propagation of carriers in the minibands. In particular, the minority-carrier hole mobility is fundamentally limited by the nonideal properties of the superlattice, namely the layer-thickness fluctuation and the nonuniform antimony distribution. Furthermore, upon reducing the temperature, holes become fully localized and transport occurs by hopping, which explains published measured detector data that demonstrates the quantum efficiency, exhibiting a very strong temperature dependence that degrades as the temperature is reduced. As a result, photodetectors that employ holes as minority carriers will be limited in performance, especially for long-wavelength infrared applications at low temperature. However, we find that minority-carrier electron mobility is largely unaffected by disorder, indicating the p-type absorbing layer as the preferred option.

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  • Received 27 December 2020
  • Revised 18 October 2021
  • Accepted 25 October 2021

DOI:https://doi.org/10.1103/PhysRevApplied.16.054028

© 2021 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

E. Bellotti1,*, F. Bertazzi2, A. Tibaldi2, J. Schuster1,3, J. Bajaj3, and M. Reed3

  • 1Department of Electrical and Computer Engineering (ECE), Boston University, 8 Saint Mary’s Street, Boston, Massachusetts 02215, USA
  • 2Department of Electronics and Telecommunications (DET), Politecnico di Torino and IEIIT-CNR, Torino 10129, Italy
  • 3U.S. Army Combat Capabilities Development Command (DEVCOM), Army Research Laboratory (ARL), 2800 Powder Mill Road, Adelphi, Maryland 20783-1138, USA

  • *bellotti@bu.edu

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Vol. 16, Iss. 5 — November 2021

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