Dynamics of Low-Energy Electron Attachment to Formic Acid

T. N. Rescigno, C. S. Trevisan, and A. E. Orel
Phys. Rev. Lett. 96, 213201 – Published 30 May 2006

Abstract

Low-energy electrons (<2eV) can fragment gas phase formic acid (HCOOH) molecules through resonant dissociative attachment processes. Recent experiments have shown that the principal reaction products of such collisions are formate ions (HCOO) and hydrogen atoms. Using first-principles electron scattering calculations, we have identified the responsible negative ion state as a transient π* anion. Symmetry considerations dictate that the associated dissociation dynamics are intrinsically polyatomic: a second anion surface, connected to the first by a conical intersection, is involved in the dynamics and the transient anion must necessarily deform to nonplanar geometries before it can dissociate to the observed stable products.

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  • Received 4 January 2006

DOI:https://doi.org/10.1103/PhysRevLett.96.213201

©2006 American Physical Society

Authors & Affiliations

T. N. Rescigno1, C. S. Trevisan2, and A. E. Orel2

  • 1Chemical Sciences, Lawrence Berkeley National Laboratory, One Cyclotron Road, Berkeley, California 94720, USA
  • 2Department of Applied Science, University of California, Davis, California 95616, USA

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Vol. 96, Iss. 21 — 2 June 2006

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