Intrinsic Mobility of a Dissociated Dislocation in Silicon

Wei Cai, Vasily V. Bulatov, João F. Justo, Ali S. Argon, and Sidney Yip
Phys. Rev. Lett. 84, 3346 – Published 10 April 2000
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Abstract

Dislocation velocities in silicon in the experimental range of temperature and stress are studied a priori by combining a mechanistic treatment of elementary kink processes with activation energies obtained by atomistic calculations. Pronounced effects of intrinsic coupling of the dissociated partial dislocations are captured in kinetic Monte Carlo simulations, which are consistent with observed velocity variations with applied stress. As a result, the nature of “weak obstacles” to kink propagation, a long-standing postulate in previous data interpretation, is clarified. A striking new effect is predicted and offered for experimental verification when dislocation velocity shows nonmonotonic oscillatory behavior with increasing stress.

  • Received 11 November 1999

DOI:https://doi.org/10.1103/PhysRevLett.84.3346

©2000 American Physical Society

Authors & Affiliations

Wei Cai1, Vasily V. Bulatov1,2, João F. Justo3, Ali S. Argon1, and Sidney Yip1

  • 1Massachusetts Institute of Technology, Cambridge, Massachusetts 02139
  • 2Lawrence Livermore National Laboratory, University of California, Livermore, California 94550
  • 3Instituto de Fisica da Universidade de São Paulo, CP 66318, CEP 05315-970 São Paulo-SP, Brazil

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Vol. 84, Iss. 15 — 10 April 2000

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