Atomic Structure of the c( 4×2) Surface Reconstruction of Ge(001) as Determined by X-Ray Diffraction

S. Ferrer, X. Torrelles, V. H. Etgens, H. A. van der Vegt, and P. Fajardo
Phys. Rev. Lett. 75, 1771 – Published 28 August 1995
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Abstract

The c(4×2) reconstruction of Ge(001) has been studied by x-ray diffraction of 150 K by measuring in-plane reflections and out-of-plane intensities of fractional order rods. The structure consists of an alternate arrangement of buckled dimers (tilt angle 191) along the [110] and [ 11¯0] surface directions. The dimer rows are not straight along the [110] direction but show a slight zigzag with an amplitude of 0.3400.005 Å.

  • Received 11 October 1994

DOI:https://doi.org/10.1103/PhysRevLett.75.1771

©1995 American Physical Society

Authors & Affiliations

S. Ferrer, X. Torrelles, V. H. Etgens, H. A. van der Vegt, and P. Fajardo

  • European Synchrotron Radiation Facility, BP 220, 38043 Grenoble Cedex, France

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Vol. 75, Iss. 9 — 28 August 1995

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