In situ x-ray reflectivity and diffraction studies of the Au(001) reconstruction in an electrochemical cell

B. M. Ocko, Jia Wang, Alison Davenport, and Hugh Isaacs
Phys. Rev. Lett. 65, 1466 – Published 17 September 1990
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Abstract

In situ x-ray specular reflectivity and glancing-incidence-angle x-ray-diffraction measurements have been performed at the Au(001) surface in a 0.01M HClO4 solution under potential control in an electrochemical cell. At -0.4 V versus an Ag/AgCl electrode, the gold surface exhibits a hexagonal reconstructed layer with a mass density 21% greater than the underlying bulk layers. The reconstruction disappears above 0.5 V, and the excess atoms form a new atomic layer with a density corresponding to 22% of a bulk layer. The reconstruction fully recovers below -0.3 V.

  • Received 31 May 1990

DOI:https://doi.org/10.1103/PhysRevLett.65.1466

©1990 American Physical Society

Authors & Affiliations

B. M. Ocko and Jia Wang

  • Physics Department, Brookhaven National Laboratory, Upton, New York 11973

Alison Davenport and Hugh Isaacs

  • Department of Applied Science, Brookhaven National Laboratory, Upton, New York 11973

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Vol. 65, Iss. 12 — 17 September 1990

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