Localized versus itinerant electrons at the metal-insulator transition in Si:P

M. Lakner and H. v. Löhneysen
Phys. Rev. Lett. 63, 648 – Published 7 August 1989
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Abstract

The specific heat C of uncompensated phosphorus-doped silicon with P concentration N between 0.34 and 7.3×1018 cm3, i.e., in the vicinity of the metal-insulator transition, has been measured over a large range of temperature (0.04 K≤T≤3 K), allowing the unambiguous detection of an anomalous contribution ΔC∼Tα, with α becoming negative for small N. This is attributed to exchange-coupled clusters. The magnetic-field dependence of C (up to 5.7 T) allows us to deduce the relative contributions of localized and delocalized electrons and gives evidence for interactions and correlations between these.

  • Received 3 April 1989

DOI:https://doi.org/10.1103/PhysRevLett.63.648

©1989 American Physical Society

Authors & Affiliations

M. Lakner and H. v. Löhneysen

  • Physikalisches Institut der Universität Karlsruhe, D-7500 Karlsruhe, Federal Republic of Germany

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Vol. 63, Iss. 6 — 7 August 1989

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