Finite-Size Effects in a CuMn Spin-Glass

G. G. Kenning; J. M. Slaughter; J. A. Cowen

doi:10.1103/PhysRevLett.59.2596

Finite-Size Effects in a CuMn Spin-Glass

G. G. Kenning, J. M. Slaughter, and J. A. Cowen

Phys. Rev. Lett. 59, 2596 – Published 30 November 1987

Abstract

Using dc sputtering in an UHV system we have prepared multilayer samples of Cu:Mn-Si with Cu:Mn thicknesses, $L$ , between 4 and 500 nm. The temperature of the peak in the dc magnetic susceptibility of these spin-glass samples shifts with $L$ as $\frac{(T_{g 0} - T_{g})}{T_{g 0}} \approx L^{- 0.75 \pm 0.06}$ over the whole range of sample thickness. These results are discussed in terms of finite-size scaling and the possible effects of the electron mean free path on the effective exchange interaction.