Crystallization instability at the amorphous-silicon/liquid-silicon interface

J. Y. Tsao and P. S. Peercy
Phys. Rev. Lett. 58, 2782 – Published 29 June 1987
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Abstract

The rate at which crystalline-Si nucleates at the amorphous-Si/liquid-Si interface is estimated. On the basis of this estimate and physical arguments, we propose that under certain conditions a moving amorphous-Si/liquid-Si interface is unstable with respect to nucleation of crystalline Si. Such nucleation, followed by growth, is a possible mechanism for the well-known explosive crystallization of amorphous Si. Furthermore, a similar instability can explain the formation of amorphous Si from liquid Si.

  • Received 4 December 1986

DOI:https://doi.org/10.1103/PhysRevLett.58.2782

©1987 American Physical Society

Authors & Affiliations

J. Y. Tsao and P. S. Peercy

  • Sandia National Laboratories, Albuquerque, New Mexico 87185

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Issue

Vol. 58, Iss. 26 — 29 June 1987

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