Ionization Energy Loss of Relativistic Electrons in Thin Silicon Detectors

W. Ogle, P. Goldstone, C. Gruhn, and C. Maggiore
Phys. Rev. Lett. 40, 1242 – Published 8 May 1978
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Abstract

We have measured the ionization loss of electrons with Lorentz factors γ=2.91 and 1.6×104<~γ<~105 passing through a (100.71 ± 0.15)-μm silicon detector. Our results are in agreement with accepted theory for γ=2.91 and γ=1.6×104; however, for γ>~3×104 our results are systematically (7 ± 2)% below the theoretical value. We suggest an explanation in terms of the finite detector thickness and a relativistic effect.

  • Received 31 January 1978

DOI:https://doi.org/10.1103/PhysRevLett.40.1242

©1978 American Physical Society

Authors & Affiliations

W. Ogle, P. Goldstone, C. Gruhn, and C. Maggiore

  • University of California, Los Alamos Scientific Laboratory, Los Alamos, New Mexico 87545

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Issue

Vol. 40, Iss. 19 — 8 May 1978

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