The resistivity of an ultrathin bismuth film has been observed and analyzed according to a two-dimensional continuum percolation model. This novel approach has produced interesting results such as the critical area fraction $x_c=0.67\mathrm{}$, the critical exponent $\alpha =1.15\mathrm{}$, and other features consistent with the two-dimensional continuum model of percolation.

• Received 7 January 1976

DOI:https://doi.org/10.1103/PhysRevLett.37.526