Abstract
The pressure dependence of the reflectivity of trigonal and amorphous Se has been measured between 1.1 and 4.5 eV using a new technique. The results indicate that local-field corrections are large. Structure near 2 eV suggests a localized excitation in both the amorphous and the crystalline material.
- Received 8 December 1975
DOI:https://doi.org/10.1103/PhysRevLett.36.740
©1976 American Physical Society
