Structural simplicity as a restraint on the structure of amorphous silicon

Matthew J. Cliffe, Albert P. Bartók, Rachel N. Kerber, Clare P. Grey, Gábor Csányi, and Andrew L. Goodwin
Phys. Rev. B 95, 224108 – Published 30 June 2017
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Abstract

Understanding the structural origins of the properties of amorphous materials remains one of the most important challenges in structural science. In this study, we demonstrate that local “structural simplicity”, embodied by the degree to which atomic environments within a material are similar to each other, is a powerful concept for rationalizing the structure of amorphous silicon (a-Si) a canonical amorphous material. We show, by restraining a reverse Monte Carlo refinement against pair distribution function (PDF) data to be simpler, that the simplest model consistent with the PDF is a continuous random network (CRN). A further effect of producing a simple model of a-Si is the generation of a (pseudo)gap in the electronic density of states, suggesting that structural homogeneity drives electronic homogeneity. That this method produces models of a-Si that approach the state-of-the-art without the need for chemically specific restraints (beyond the assumption of homogeneity) suggests that simplicity-based refinement approaches may allow experiment-driven structural modeling techniques to be developed for the wide variety of amorphous semiconductors with strong local order.

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  • Received 2 September 2016

DOI:https://doi.org/10.1103/PhysRevB.95.224108

©2017 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied PhysicsStatistical Physics & Thermodynamics

Authors & Affiliations

Matthew J. Cliffe1,2,*, Albert P. Bartók3, Rachel N. Kerber1, Clare P. Grey1, Gábor Csányi3, and Andrew L. Goodwin2

  • 1Department of Chemistry, Lensfield Road, University of Cambridge, CB2 1EW, United Kingdom
  • 2Department of Chemistry, South Parks Road, University of Oxford, OX1 3QR, United Kingdom
  • 3Department of Engineering, Trumpington Street, University of Cambridge, CB2 1PZ, United Kingdom

  • *mjc222@cam.ac.uk

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Issue

Vol. 95, Iss. 22 — 1 June 2017

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