Hybrid functional calculations of DX centers in AlN and GaN

L. Gordon, J. L. Lyons, A. Janotti, and C. G. Van de Walle
Phys. Rev. B 89, 085204 – Published 18 February 2014

Abstract

Using hybrid functional calculations, we investigate the formation of DX centers in GaN and AlN. We find that O, Si, and Ge are shallow donors in GaN, but form stable DX centers in AlN for Fermi-level positions near the conduction band. Using a linear interpolation, we estimate the composition at which the onset of DX behavior will occur in AlGaN alloys. Based on these predictions, we identify Si as the most effective donor for high Al-content AlGaN, and explain a number of seemingly conflicting experimental results for Si-doped AlGaN. Although based on size matching Ge was expected to be superior to Si as a shallow donor, it actually turns out to be more prone to DX-center formation.

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  • Received 5 November 2013

DOI:https://doi.org/10.1103/PhysRevB.89.085204

©2014 American Physical Society

Authors & Affiliations

L. Gordon*, J. L. Lyons, A. Janotti, and C. G. Van de Walle

  • Materials Department, University of California, Santa Barbara, California 93106-5050, USA

  • *lukegordon@engineering.ucsb.edu

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Issue

Vol. 89, Iss. 8 — 15 February 2014

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