Coherent excitation of the optic phonon in Si: Transiently stimulated Raman scattering with a finite-lifetime electronic excitation

D. M. Riffe and A. J. Sabbah
Phys. Rev. B 76, 085207 – Published 17 August 2007

Abstract

Using 28fs, 800nm laser pulses we have coherently excited and subsequently probed, with time-dependent reflectivity, the Si zone-center optic phonon. The phonon-induced reflectivity change ΔRR is well described by the response of an underdamped oscillator: ΔRRexp(tτph)cos(2πtTph+ϕ). The measured phase ϕ indicates that transiently stimulated Raman scattering (TSRS) is responsible for the coherent-phonon generation: our results are in good agreement with a recent theory of TSRS for opaque materials [T. E. Stevens et al., Phys. Rev. B 65, 144304 (2002)] when we extend the theory to include the finite lifetime of the excited charge density that couples to the oscillation. We also discuss previous experimental results on Te, Bi, Sb, Si, and Ge in light of this extended theory. Additionally, our measured period Tph and decay time τph of the Si coherent oscillation are consistent with carrier-density-dependent Raman-scattering measurements.

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  • Received 23 April 2007

DOI:https://doi.org/10.1103/PhysRevB.76.085207

©2007 American Physical Society

Authors & Affiliations

D. M. Riffe and A. J. Sabbah*

  • Physics Department, Utah State University, Logan, Utah 84322-4415, USA

  • *Present address: Physics Department, Colorado School of Mines, Golden, CO 80401.

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Issue

Vol. 76, Iss. 8 — 15 August 2007

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