X-ray resonant magnetic scattering study of magnetic stripe domains in aGdFe thin films

J. Miguel, J. F. Peters, O. M. Toulemonde, S. S. Dhesi, N. B. Brookes, and J. B. Goedkoop
Phys. Rev. B 74, 094437 – Published 29 September 2006

Abstract

X-ray resonant magnetic scattering (XRMS) has been used to investigate the structure of magnetic stripe domain patterns in thin amorphous GdFe films. Under the influence of a perpendicular magnetic field, the scattered intensity displays a smooth transition from a structure factor of correlated stripes to the form factor of isolated domains. We derive a quite general expression that relates the total scattered intensity of XRMS to the absolute value of the magnetization. Furthermore, we compare our results for the domain period with domain theory. We obtain good agreement for prealigned stripes, but disorder tends to lead to an overestimation of the period measured with XRMS.

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  • Received 10 March 2006

DOI:https://doi.org/10.1103/PhysRevB.74.094437

©2006 American Physical Society

Authors & Affiliations

J. Miguel1,*, J. F. Peters1,†, O. M. Toulemonde1,‡, S. S. Dhesi2,§, N. B. Brookes2, and J. B. Goedkoop1

  • 1Van der Waals-Zeeman Institute, University of Amsterdam, Valckenierstraat 65, 1018 XE, Amsterdam, The Netherlands
  • 2European Synchrotron Radiation Facility, ESRF, Boîte Postale 220, F-38043 Grenoble Cedex, France

  • *Present address: Institut für Experimentalphysik, Freie Universität Berlin, D-14195 Berlin, Germany. Electronic address: miguel@physik.fu-berlin.de
  • Present address: Philips Medical Systems, P.O. Box 10.000, 5680 DA Best, The Netherlands.
  • Present address: ICMCB, UPR 9048 CNRS, Université Bordeaux I, 87 Avenue Dr. A. Schweitzer, 33608 Pessac, France.
  • §Present address: Diamond Light Source, Chilton, Didcot, Oxfordshire OX11 0QX, United Kingdom.

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Issue

Vol. 74, Iss. 9 — 1 September 2006

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